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Zhuhai Zhenli Optical Instrument Co., Ltd.

Date:2025-08-07

Zhenli Optical Instrument Co., Ltd. specializes in the research, development, and manufacture of high-end particle characterization instruments. Its product offerings include laser (diffraction) particle size analyzers, dynamic light scattering nanoparticle size analyzers, zeta potential analyzers, and particle image analyzers, encompassing both laboratory instruments and online detection systems. Adhering to a "scientific approach and craftsman spirit," Zhenli Optical provides users with world-leading, high-end products and services.

Truth Optics brings together leading experts in particle characterization nationwide, led by Dr. Zhang Fugen. Dr. Zhang serves as Chairman and Chief Scientist of the company. He also serves as Vice Chairman of the National Technical Committee for Particle Characterization, Sorting, and Screening Standardization, an Adjunct Professor at Tianjin University, and a former Vice President of the Chinese Society of Particulation. He is also the founder of the "Omeike" brand. Mr. Qin Heyi, who served as General Manager of China for a British particle size instrumentation company for over 20 years, serves as the company's General Manager for Commercial Affairs. Dr. Pan Linchao and Dr. Chen Jin, Young Directors of the Chinese Society of Particulation, spearhead the company's R&D efforts.
Although laser (diffraction) particle size analyzers have been widely used, they are not perfect, either in terms of scientific basis or technical solutions. In response to the shortcomings of current instruments on the market, the team of Truth Optics has carried out systematic theoretical research and technological innovation, discovered the anomalous change phenomenon (ACAD) of the diffraction spot (Airy disk), explained why polystyrene microspheres around 3um cannot be measured, and provided a general formula for the anomalous zone (particle size cannot be measured). They also studied the upper and lower limits of the diffraction instrument.The upper and lower limits of the measurement of the instrument were determined; the influence of the particle refractive index deviation on the measurement results was studied, and two methods for estimating the particle refractive index based on the scattered light distribution were invented; a slanted trapezoidal window technology solution (patent) was proposed to solve the problem of blind spots in forward ultra-large angle measurements, significantly improving the submicron particle measurement level of the diffraction instrument; a unified inversion algorithm (proprietary technology) was proposed to eliminate the embarrassment of different calculation modes giving different results; an ultra-high-speed parallel data sampling circuit with a speed of up to 20Kfps was designed, making the dry method measurement accuracy no less than that of the wet method, and the measurement (time) resolution of high-speed spray fields is also higher.
In the field of nanoparticle size and Zeta potential analysis, Truth Optics has proposed a cosine fitting phase analysis method (CF-PALS) that is more advanced than the phase analysis method (PALS). It replaces the traditional flat beam splitter with optical fiber splitting and replaces free space interference with intra-fiber light interference, which greatly improves the repeatability of Zeta potential measurement.